X-ray performance of gratings in the extreme off-plane mount

Randall L. McEntaffer, Steven Osterman, Webster Cash, John Gilchrist, Jean Flamand, Bruno Touzet, Fransis Bonnemason, Christian Brach

Research output: Contribution to journalConference article

32 Scopus citations

Abstract

High groove density reflection gratings placed at grazing incidence in the extreme off-plane mount offer increased performance over conventional in-plane mounts in the x-ray. We present initial off-plane efficiency test results from the grating evaluation facility at the University of Colorado. The test gratings are holographically ruled, ion-etched gratings with radial groove profiles that were developed and fabricated by Jobin-Yvon Inc.

Original languageEnglish (US)
Pages (from-to)492-498
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5168
DOIs
StatePublished - 2004
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy - San Diego, CA, United States
Duration: Aug 4 2003Aug 7 2003

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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    McEntaffer, R. L., Osterman, S., Cash, W., Gilchrist, J., Flamand, J., Touzet, B., Bonnemason, F., & Brach, C. (2004). X-ray performance of gratings in the extreme off-plane mount. Proceedings of SPIE - The International Society for Optical Engineering, 5168, 492-498. https://doi.org/10.1117/12.506200