Abstract
The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 187-203 |
| Number of pages | 17 |
| Journal | ASTM Special Technical Publication |
| Issue number | 643 |
| State | Published - Jan 1 1978 |
| Event | Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc - Cleveland, OH, USA Duration: Mar 2 1977 → Mar 3 1977 |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
Cite this
Shepard, A., Hewitt, R. W., Baitinger, W. E., Slusser, G. J., Winograd, N., Ott, G. L., & Delgass, W. N. (1978). X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY: A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS. ASTM Special Technical Publication, (643), 187-203.