Abstract
The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 187-203 |
| Number of pages | 17 |
| Journal | ASTM Special Technical Publication |
| Issue number | 643 |
| State | Published - Jan 1 1978 |
| Event | Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc - Cleveland, OH, USA Duration: Mar 2 1977 → Mar 3 1977 |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
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X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY : A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS. / Shepard, A.; Hewitt, R. W.; Baitinger, W. E.; Slusser, G. J.; Winograd, Nicholas; Ott, G. L.; Delgass, W. N.
In: ASTM Special Technical Publication, No. 643, 01.01.1978, p. 187-203.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY
T2 - A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS.
AU - Shepard, A.
AU - Hewitt, R. W.
AU - Baitinger, W. E.
AU - Slusser, G. J.
AU - Winograd, Nicholas
AU - Ott, G. L.
AU - Delgass, W. N.
PY - 1978/1/1
Y1 - 1978/1/1
N2 - The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
AB - The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
UR - http://www.scopus.com/inward/record.url?scp=0017914758&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0017914758&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0017914758
SP - 187
EP - 203
JO - ASTM Special Technical Publication
JF - ASTM Special Technical Publication
SN - 0066-0558
IS - 643
ER -