Abstract
The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
Original language | English (US) |
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Pages (from-to) | 187-203 |
Number of pages | 17 |
Journal | ASTM Special Technical Publication |
Issue number | 643 |
DOIs | |
State | Published - 1978 |
Event | Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc - Cleveland, OH, USA Duration: Mar 2 1977 → Mar 3 1977 |
All Science Journal Classification (ASJC) codes
- Engineering(all)