X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY: A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS.

A. Shepard; R. W. Hewitt; W. E. Baitinger; G. J. Slusser; Nicholas Winograd; G. L. Ott; W. N. Delgass

doi:10.1520/stp25608s

X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY: A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS.

A. Shepard, R. W. Hewitt, W. E. Baitinger, G. J. Slusser, Nicholas Winograd, G. L. Ott, W. N. Delgass

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.

Original language	English (US)
Pages (from-to)	187-203
Number of pages	17
Journal	ASTM Special Technical Publication
Issue number	643
DOIs	https://doi.org/10.1520/stp25608s
State	Published - 1978
Event	Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc - Cleveland, OH, USA Duration: Mar 2 1977 → Mar 3 1977

All Science Journal Classification (ASJC) codes

Engineering(all)

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10.1520/stp25608s

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title = "X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY: A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS.",

abstract = "The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.",

author = "A. Shepard and Hewitt, {R. W.} and Baitinger, {W. E.} and Slusser, {G. J.} and Nicholas Winograd and Ott, {G. L.} and Delgass, {W. N.}",

year = "1978",

doi = "10.1520/stp25608s",

language = "English (US)",

pages = "187--203",

journal = "ASTM Special Technical Publication",

issn = "0066-0558",

number = "643",

note = "Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc ; Conference date: 02-03-1977 Through 03-03-1977",

}

X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY : A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS. / Shepard, A.; Hewitt, R. W.; Baitinger, W. E.; Slusser, G. J.; Winograd, Nicholas; Ott, G. L.; Delgass, W. N.

In: ASTM Special Technical Publication, No. 643, 1978, p. 187-203.

Research output: Contribution to journal › Conference article › peer-review

TY - JOUR

T1 - X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

T2 - Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc

AU - Shepard, A.

AU - Hewitt, R. W.

AU - Baitinger, W. E.

AU - Slusser, G. J.

AU - Winograd, Nicholas

AU - Ott, G. L.

AU - Delgass, W. N.

PY - 1978

Y1 - 1978

N2 - The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.

AB - The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.

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DO - 10.1520/stp25608s

M3 - Conference article

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SP - 187

EP - 203

JO - ASTM Special Technical Publication

JF - ASTM Special Technical Publication

SN - 0066-0558

IS - 643

Y2 - 2 March 1977 through 3 March 1977

ER -

X-RAY PHOTOELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY: A MULTITECHNIQUE APPROACH TO SURFACE ANALYSIS.

Abstract

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