The combination of X-ray photoelectron spectroscopy (XPS) with seconary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, the ultrahigh vacuum XPX/SIMS system was tested to characterize a variety of metal, alloy, and metal oxygen surfaces. The examination of clean silver surfaces where ions of clusters up to Ag//n** plus where n equals 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen.
|Original language||English (US)|
|Number of pages||17|
|Journal||ASTM Special Technical Publication|
|State||Published - Jan 1 1978|
|Event||Quant Surf Anal of Mater, Symp held in conjunction with Pittsburgh Conf on Anal Chem and Appl Spectrosc - Cleveland, OH, USA|
Duration: Mar 2 1977 → Mar 3 1977
All Science Journal Classification (ASJC) codes