X-ray photoemission studies of atom implanted matrices: Cu, Ag, and Au in SiO2

V. Y. Young, R. A. Gibbs, Nicholas Winograd

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

X-ray photoelectron spectroscopy has been used to study the electronic structure of Cu,Ag, and Au atoms implanted in SiO2. In each case the valence levels shifted to higher binding energy and narrowed compared to the bulk metals, approaching the expected shape of the gas phase free atom spectra. A model is presented which allows calculation of photoemission and Auger energies from atomic spectra, and is shown to accurately predict the observed spectra.

Original languageEnglish (US)
Pages (from-to)5714-5721
Number of pages8
JournalThe Journal of Chemical Physics
Volume70
Issue number12
DOIs
StatePublished - Jan 1 1979

Fingerprint

Photoemission
photoelectric emission
atomic spectra
X rays
Atoms
matrices
Binding energy
Electronic structure
atoms
x rays
X ray photoelectron spectroscopy
binding energy
Gases
Metals
photoelectron spectroscopy
vapor phases
electronic structure
valence
metals
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Cite this

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X-ray photoemission studies of atom implanted matrices : Cu, Ag, and Au in SiO2. / Young, V. Y.; Gibbs, R. A.; Winograd, Nicholas.

In: The Journal of Chemical Physics, Vol. 70, No. 12, 01.01.1979, p. 5714-5721.

Research output: Contribution to journalArticle

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