X-ray photoemission studies of atom implanted solids: Ag and Au in SiO2

V. Y. Young, R. A. Gibbs, N. Winograd, K. S. Kim

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The electronic structure of single atoms of Ag and Au implanted in SiO2 has been examined using X-ray photoemission. In this dilute limit the valence band narrows by 1- eV, approaching the expected shape of the gas phase free atom. This observation supports a model for the implanted atom where the influence of the SiO2 matrix only slightly perturbs the atomic wavefunctions of the free atom.

Original languageEnglish (US)
Pages (from-to)378-382
Number of pages5
JournalChemical Physics Letters
Volume54
Issue number2
DOIs
StatePublished - Mar 1 1978

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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