X-ray Scattering Measurements of Helium Adsorption into Silica Aerogel

L. B. Lurio, N. Mulders, M. Paetkau, M. Lee, S. G.J. Mochri, M. H.W. Chan

Research output: Contribution to journalArticlepeer-review

11 Citations (SciVal)

Abstract

We have performed simultaneous adsorption isotherm and small angle x-ray scattering (SAXS) measurements of 4He adsorption into 98% porous aerogel at 3.5K. Measurements indicate a two phase coexistence at vapor pressures slightly below the bulk liquid-vapor equilibrium point. SAXS data are interpreted according to a model which consists of the coexistence of a film phase where the aerogel strands are coated with a liquid film and a filled-pore phase were the pores defined by neighboring strands are filled with liquid.

Original languageEnglish (US)
Pages (from-to)591-596
Number of pages6
JournalJournal of Low Temperature Physics
Volume121
Issue number5-6
DOIs
StatePublished - 2000

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'X-ray Scattering Measurements of Helium Adsorption into Silica Aerogel'. Together they form a unique fingerprint.

Cite this