X-ray verification of an optically aligned off-plane grating module

Benjamin D. Donovan, Randall Lee McEntaffer, James Henry Tutt, Casey T. Deroo, Ryan Allured, Jessica A. Gaskin, Jeffery J. Kolodziejczak

Research output: Contribution to journalArticle

7 Scopus citations


Off-plane x-ray reflection gratings are theoretically capable of achieving high resolution and high diffraction efficiencies over the soft x-ray bandpass, making them an ideal technology to implement on upcoming x-ray spectroscopy missions. To achieve high effective area, these gratings must be aligned into grating modules. X-ray testing was performed on an aligned grating module to assess the current optical alignment methods. Results indicate that the grating module achieved the desired alignment for an upcoming x-ray spectroscopy suborbital rocket payload with modest effective area and resolving power. These tests have also outlined a pathway towards achieving the stricter alignment tolerances of future x-ray spectrometer payloads, which require improvements in alignment metrology, grating fabrication, and testing techniques.

Original languageEnglish (US)
Pages (from-to)454-464
Number of pages11
JournalApplied Optics
Issue number3
StatePublished - Jan 20 2018

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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  • Cite this

    Donovan, B. D., McEntaffer, R. L., Tutt, J. H., Deroo, C. T., Allured, R., Gaskin, J. A., & Kolodziejczak, J. J. (2018). X-ray verification of an optically aligned off-plane grating module. Applied Optics, 57(3), 454-464. https://doi.org/10.1364/AO.57.000454