X-ray verification of an optically aligned off-plane grating module

Benjamin D. Donovan, Randall Lee McEntaffer, James Henry Tutt, Casey T. Deroo, Ryan Allured, Jessica A. Gaskin, Jeffery J. Kolodziejczak

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Off-plane x-ray reflection gratings are theoretically capable of achieving high resolution and high diffraction efficiencies over the soft x-ray bandpass, making them an ideal technology to implement on upcoming x-ray spectroscopy missions. To achieve high effective area, these gratings must be aligned into grating modules. X-ray testing was performed on an aligned grating module to assess the current optical alignment methods. Results indicate that the grating module achieved the desired alignment for an upcoming x-ray spectroscopy suborbital rocket payload with modest effective area and resolving power. These tests have also outlined a pathway towards achieving the stricter alignment tolerances of future x-ray spectrometer payloads, which require improvements in alignment metrology, grating fabrication, and testing techniques.

Original languageEnglish (US)
Pages (from-to)454-464
Number of pages11
JournalApplied Optics
Volume57
Issue number3
DOIs
StatePublished - Jan 20 2018

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modules
gratings
X rays
alignment
x rays
payloads
x ray spectroscopy
Spectroscopy
x ray spectrometers
Diffraction efficiency
Optical resolving power
Testing
Rockets
rockets
metrology
Spectrometers
Fabrication
fabrication
high resolution
diffraction

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Donovan, B. D., McEntaffer, R. L., Tutt, J. H., Deroo, C. T., Allured, R., Gaskin, J. A., & Kolodziejczak, J. J. (2018). X-ray verification of an optically aligned off-plane grating module. Applied Optics, 57(3), 454-464. https://doi.org/10.1364/AO.57.000454
Donovan, Benjamin D. ; McEntaffer, Randall Lee ; Tutt, James Henry ; Deroo, Casey T. ; Allured, Ryan ; Gaskin, Jessica A. ; Kolodziejczak, Jeffery J. / X-ray verification of an optically aligned off-plane grating module. In: Applied Optics. 2018 ; Vol. 57, No. 3. pp. 454-464.
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Donovan, BD, McEntaffer, RL, Tutt, JH, Deroo, CT, Allured, R, Gaskin, JA & Kolodziejczak, JJ 2018, 'X-ray verification of an optically aligned off-plane grating module', Applied Optics, vol. 57, no. 3, pp. 454-464. https://doi.org/10.1364/AO.57.000454

X-ray verification of an optically aligned off-plane grating module. / Donovan, Benjamin D.; McEntaffer, Randall Lee; Tutt, James Henry; Deroo, Casey T.; Allured, Ryan; Gaskin, Jessica A.; Kolodziejczak, Jeffery J.

In: Applied Optics, Vol. 57, No. 3, 20.01.2018, p. 454-464.

Research output: Contribution to journalArticle

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