XPS spectroscopic study of potentiostatic and galvanostatic oxidation of Pt electrodes in H2SO4 and HClO4

J. S. Hammond, Nicholas Winograd

Research output: Contribution to journalArticle

168 Citations (Scopus)

Abstract

The surface oxides produced from potentiostatic and galvanostatic oxidation of Pt electrodes in HClO4 and H2SO4 are examined using X-ray photoelectron spectroscopy. The oxide I species produced as the initial oxidation product by successively more anodic potentiostatic oxidation in 0.2 M HClO4 is found to have a Pt2+ oxidation state, a binding energy characteristic of neither PtO, Pt(OH)2 or PtO2, and a limiting thickness of 8 Å. Galvanostatic oxidation in HClO4 and H2SO4 is found to produce PtO2·H2O as an unlimiting growth oxide or a limiting growth oxide layer depending on the concentration of the acid electrolyte. The incorporation of the acid electrolyte anion in the surface layer is shown to have an effect on which type of oxide layer is produced. X-ray decomposition and chemical modification by Ar+ stripping are shown to produce chemical artifacts complicating any interpretation of a Pt oxide surface layer.

Original languageEnglish (US)
Pages (from-to)55-69
Number of pages15
JournalJournal of Electroanalytical Chemistry
Volume78
Issue number1
DOIs
StatePublished - May 10 1977

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Oxides
X ray photoelectron spectroscopy
Oxidation
Electrodes
Electrolytes
Acids
Chemical modification
Anodic oxidation
Binding energy
Anions
Negative ions
Decomposition
X rays

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Chemical Engineering(all)
  • Electrochemistry

Cite this

@article{07c91e50e9b14e9c9fa2cd508d4e7079,
title = "XPS spectroscopic study of potentiostatic and galvanostatic oxidation of Pt electrodes in H2SO4 and HClO4",
abstract = "The surface oxides produced from potentiostatic and galvanostatic oxidation of Pt electrodes in HClO4 and H2SO4 are examined using X-ray photoelectron spectroscopy. The oxide I species produced as the initial oxidation product by successively more anodic potentiostatic oxidation in 0.2 M HClO4 is found to have a Pt2+ oxidation state, a binding energy characteristic of neither PtO, Pt(OH)2 or PtO2, and a limiting thickness of 8 {\AA}. Galvanostatic oxidation in HClO4 and H2SO4 is found to produce PtO2·H2O as an unlimiting growth oxide or a limiting growth oxide layer depending on the concentration of the acid electrolyte. The incorporation of the acid electrolyte anion in the surface layer is shown to have an effect on which type of oxide layer is produced. X-ray decomposition and chemical modification by Ar+ stripping are shown to produce chemical artifacts complicating any interpretation of a Pt oxide surface layer.",
author = "Hammond, {J. S.} and Nicholas Winograd",
year = "1977",
month = "5",
day = "10",
doi = "10.1016/S0022-0728(77)80422-1",
language = "English (US)",
volume = "78",
pages = "55--69",
journal = "Journal of Electroanalytical Chemistry",
issn = "0368-1874",
publisher = "Elsevier Sequoia",
number = "1",

}

XPS spectroscopic study of potentiostatic and galvanostatic oxidation of Pt electrodes in H2SO4 and HClO4. / Hammond, J. S.; Winograd, Nicholas.

In: Journal of Electroanalytical Chemistry, Vol. 78, No. 1, 10.05.1977, p. 55-69.

Research output: Contribution to journalArticle

TY - JOUR

T1 - XPS spectroscopic study of potentiostatic and galvanostatic oxidation of Pt electrodes in H2SO4 and HClO4

AU - Hammond, J. S.

AU - Winograd, Nicholas

PY - 1977/5/10

Y1 - 1977/5/10

N2 - The surface oxides produced from potentiostatic and galvanostatic oxidation of Pt electrodes in HClO4 and H2SO4 are examined using X-ray photoelectron spectroscopy. The oxide I species produced as the initial oxidation product by successively more anodic potentiostatic oxidation in 0.2 M HClO4 is found to have a Pt2+ oxidation state, a binding energy characteristic of neither PtO, Pt(OH)2 or PtO2, and a limiting thickness of 8 Å. Galvanostatic oxidation in HClO4 and H2SO4 is found to produce PtO2·H2O as an unlimiting growth oxide or a limiting growth oxide layer depending on the concentration of the acid electrolyte. The incorporation of the acid electrolyte anion in the surface layer is shown to have an effect on which type of oxide layer is produced. X-ray decomposition and chemical modification by Ar+ stripping are shown to produce chemical artifacts complicating any interpretation of a Pt oxide surface layer.

AB - The surface oxides produced from potentiostatic and galvanostatic oxidation of Pt electrodes in HClO4 and H2SO4 are examined using X-ray photoelectron spectroscopy. The oxide I species produced as the initial oxidation product by successively more anodic potentiostatic oxidation in 0.2 M HClO4 is found to have a Pt2+ oxidation state, a binding energy characteristic of neither PtO, Pt(OH)2 or PtO2, and a limiting thickness of 8 Å. Galvanostatic oxidation in HClO4 and H2SO4 is found to produce PtO2·H2O as an unlimiting growth oxide or a limiting growth oxide layer depending on the concentration of the acid electrolyte. The incorporation of the acid electrolyte anion in the surface layer is shown to have an effect on which type of oxide layer is produced. X-ray decomposition and chemical modification by Ar+ stripping are shown to produce chemical artifacts complicating any interpretation of a Pt oxide surface layer.

UR - http://www.scopus.com/inward/record.url?scp=0002794714&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0002794714&partnerID=8YFLogxK

U2 - 10.1016/S0022-0728(77)80422-1

DO - 10.1016/S0022-0728(77)80422-1

M3 - Article

AN - SCOPUS:0002794714

VL - 78

SP - 55

EP - 69

JO - Journal of Electroanalytical Chemistry

JF - Journal of Electroanalytical Chemistry

SN - 0368-1874

IS - 1

ER -