Zero-load friction at nanowire-silicon interfaces

Mohan Manoharan, Md Amanul Haque

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The dominance of adhesive forces at the nanoscale implies that significant friction forces can be generated at the interface even with no externally applied normal load. We have nanofabricated an adhesion-friction force sensor to characterize friction in zinc oxide nanowires on silicon substrates. Experimental results show static friction coefficients for zero externally applied normal load can be as high as 45. This behavior is observed to be strongly influenced by the ambient conditions and we propose that the presence of molecularly thin moisture layers is responsible for the observed pseudo-static friction. The findings of this study will provide valuable input to nanoscale interfacial systems such as nanowires and nanotube based sensors and nanocomposites.

Original languageEnglish (US)
Title of host publicationASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
Pages535-538
Number of pages4
DOIs
StatePublished - Dec 1 2008
EventASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008 - Brooklyn, NY, United States
Duration: Aug 3 2008Aug 6 2008

Publication series

NameProceedings of the ASME Design Engineering Technical Conference
Volume4

Other

OtherASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
CountryUnited States
CityBrooklyn, NY
Period8/3/088/6/08

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All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Mechanical Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Manoharan, M., & Haque, M. A. (2008). Zero-load friction at nanowire-silicon interfaces. In ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008 (pp. 535-538). (Proceedings of the ASME Design Engineering Technical Conference; Vol. 4). https://doi.org/10.1115/DETC2008-49818