TY - JOUR
T1 - Zinc selenide analyzed by XPS
AU - Shallenberger, Jeffrey R.
AU - Hellgren, Niklas
N1 - Funding Information:
This work was supported by the Penn State Center for Nanoscale Science NSF-MRSEC Grant (No. DMR-0820404).
PY - 2020/6/1
Y1 - 2020/6/1
N2 - Zinc selenide (ZnSe) was analyzed using x-ray photoelectron spectroscopy (XPS). A small notched rod was fractured in the XPS vacuum system at 6 × 10-4Pa to create an oxygen-free surface for analysis. Spectral regions for Zn 2p, Zn 3d, Zn LMM, O 1s, C 1s, Se 3d, Se 3p, and Se LMM and valence band regions were acquired. The presence of carbon could not be confirmed due to interferences between C 1s and Se LMM and between C KLL and Zn 3s. It is believed that any carbon present is very low.
AB - Zinc selenide (ZnSe) was analyzed using x-ray photoelectron spectroscopy (XPS). A small notched rod was fractured in the XPS vacuum system at 6 × 10-4Pa to create an oxygen-free surface for analysis. Spectral regions for Zn 2p, Zn 3d, Zn LMM, O 1s, C 1s, Se 3d, Se 3p, and Se LMM and valence band regions were acquired. The presence of carbon could not be confirmed due to interferences between C 1s and Se LMM and between C KLL and Zn 3s. It is believed that any carbon present is very low.
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U2 - 10.1116/6.0000165
DO - 10.1116/6.0000165
M3 - Article
AN - SCOPUS:85088574043
VL - 27
JO - Surface Science Spectra
JF - Surface Science Spectra
SN - 1055-5269
IS - 1
M1 - 014020
ER -