Zinc selenide analyzed by XPS

Jeffrey R. Shallenberger, Niklas Hellgren

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Zinc selenide (ZnSe) was analyzed using x-ray photoelectron spectroscopy (XPS). A small notched rod was fractured in the XPS vacuum system at 6 × 10-4Pa to create an oxygen-free surface for analysis. Spectral regions for Zn 2p, Zn 3d, Zn LMM, O 1s, C 1s, Se 3d, Se 3p, and Se LMM and valence band regions were acquired. The presence of carbon could not be confirmed due to interferences between C 1s and Se LMM and between C KLL and Zn 3s. It is believed that any carbon present is very low.

Original languageEnglish (US)
Article number014020
JournalSurface Science Spectra
Volume27
Issue number1
DOIs
StatePublished - Jun 1 2020

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint

Dive into the research topics of 'Zinc selenide analyzed by XPS'. Together they form a unique fingerprint.

Cite this